Description
We are offering Four Probe Set-up (Research Model), it is one of the standard and most widely used method for the measurement of resistivity. In its useful form, the four probes are collinear. The error due to contact resistance, which is significant in the electrical measurement on semiconductors, is avoided by the use of two extra contacts (probes) between the current contacts. The experiment is consists of the following: 1. Probes Arrangement, FPA-RM: The probe arrangement is mounted in a suitable stand, which holds the sample plate and RTD (A class) sensor. 2. PID Controlled Oven, PID-200: This is high quality temperature controlled oven suitable for Four Probe Set-up. The oven has been designed for fast heating and cooling rates, which enhances the effectiveness of the controller. 3. Constant Current Source a) Constant Current Source, CCS-01: This current source is suitable for the resistivity measurement of low to medium resistivity samples such as thin films of metals/alloys and semiconductors such as Ge. Current Range: 0-20mA & 0-200mA (continuously variable) Accuracy: ±0.25% of the reading Resolution: 10μA at 0-20mA range Load Regulation: ±0.1% for 0 to full load Line Regulation: ±0.1% for 10% changes b) Low Current Source, LCS-02: This current source is especially suitable for the resistivity measurement of polymer films, conducting ceramics and Si crystals. Current Range: 0-2μA, 0-20μA, 0-200μA, 0-2μA Resolution: 1nA at 0.2μA range Accuracy: ±0.25% of the reading ±1 digit Load Regulation: ±0.1% for 0 to full load 4. D.C. Micro-voltmeter, DMV-001 Range: 1mV, 10mV, 100mV, 1V & 10V with 100% over-ranging Resolution: 1μV Accuracy: ±0.2% The experiment is complete in all respect.